Structural, optical, and electrical properties of 4%Co-SnO2 Films by USP Method
DOI:
https://doi.org/10.59287/as-proceedings.433Keywords:
SnO2, Co, X Ray Diffraction, Optical PropertiesAbstract
The effect of Co-doping on the structural, optical, and electrical properties of SnO2 .thin films prepared by spray pyrolysis technique at 450°C method was utilized. Thin films of Co (4%) doped SnO2 were deposited on glass substrates and characterized by X-ray diffraction (XRD), UV-Vis absorption. The tetragonal rutile-type structure was confirmed by X-ray diffraction with an average crystallite size of 20 nm. For the optical properties, the bandgap energy was determined by the Wemple-DiDomenico model. with a square resistance value of 100 Ohms Co-doped (4%). SnO2 thin films.
Downloads
Published
2023-12-11
How to Cite
Sabrina, R., & Abdelkader, D. (2023). Structural, optical, and electrical properties of 4%Co-SnO2 Films by USP Method. AS-Proceedings, 1(6), 13–15. https://doi.org/10.59287/as-proceedings.433
Issue
Section
Conference Papers