Structural, optical, and electrical properties of 4%Co-SnO2 Films by USP Method

Authors

  • Roguai Sabrina Abbes Laghrour university
  • Djelloul Abdelkader Abbes Laghrour university

DOI:

https://doi.org/10.59287/as-proceedings.433

Keywords:

SnO2, Co, X Ray Diffraction, Optical Properties

Abstract

The effect of Co-doping on the structural, optical, and electrical properties of SnO2 .thin films prepared by spray pyrolysis technique at 450°C method was utilized. Thin films of Co (4%) doped SnO2 were deposited on glass substrates and characterized by X-ray diffraction (XRD), UV-Vis absorption. The tetragonal rutile-type structure was confirmed by X-ray diffraction with an average crystallite size of 20 nm. For the optical properties, the bandgap energy was determined by the Wemple-DiDomenico model. with a square resistance value of 100 Ohms Co-doped (4%). SnO2 thin films.

Author Biographies

Roguai Sabrina, Abbes Laghrour university

Department science of the matter,  khenchela , Algeria

Djelloul Abdelkader, Abbes Laghrour university

Department science of the matter, khenchela , Algeria

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Published

2023-12-11

How to Cite

Sabrina, R., & Abdelkader, D. (2023). Structural, optical, and electrical properties of 4%Co-SnO2 Films by USP Method. AS-Proceedings, 1(6), 13–15. https://doi.org/10.59287/as-proceedings.433